文献类型：期刊文献

英文题名：Enabling High-fidelity Twin Pattern Prediction in Polycrystals - A Mesoscale Grain Boundary Plasticity Model

作者：Huang, C. Gao, B. Zhou, N. Xin, R. Tang, S. Elkhodary, K., I

第一作者：Huang, C.

通信作者：Tang, S[1];Elkhodary, KI[2]

机构：[1]Beijing Inst Technol, State Key Lab Explos Sci & Technol, Beijing, Peoples R China;[2]Beijing Inst Technol, Chongqing Innovat Ctr, Chongqing, Peoples R China;[3]Taiyuan Univ Sci & Technol, Instrumental Anal Ctr, Taiyuan, Peoples R China;[4]Guizhou Inst Technol, Sch Mat & Met Engn, Guiyang, Guizhou, Peoples R China;[5]Chongqing Univ, Coll Mat Sci & Engn, Chongqing, Peoples R China;[6]Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian, Peoples R China;[7]Amer Univ Cairo, Dept Mech Engn, New Cairo 11835, Egypt

第一机构：Beijing Inst Technol, State Key Lab Explos Sci & Technol, Beijing, Peoples R China

通信机构：corresponding author), Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian, Peoples R China;corresponding author), Amer Univ Cairo, Dept Mech Engn, New Cairo 11835, Egypt.

年份：2022

卷号：148

外文期刊名：INTERNATIONAL JOURNAL OF PLASTICITY

收录：;EI(收录号：20214411091257);Scopus(收录号：2-s2.0-85117913012);WOS:【SCI-EXPANDED(收录号:WOS:000718555900003)】；

语种：英文

外文关键词：Plasticity - Polycrystals - Single crystals

摘要：In this paper we propose a parameter-free grain boundary (GB) model for the meso-scale, employing it to effectively capture one-to-one twin pattern development across polycrystals (for the first time), by means of crystal plasticity finite element methods (CPFEM). Our model does not require higher-order mechanics, involve limiting length-scales, or demand special considerations for its FEM implementation. It derives all its data from that of its adjacent grains, which are modeled using single crystal plasticity. We apply our mesoscale GB model to experimentally imaged microstructures of Magnesium and Titanium. We demonstrate a clear ability to capture the prominent role of GBs in the nucleation and patterning of twins, with high spatiotemporal fidelity (approaching one-to-one), as compared to electron back-scattered diffraction (EBSD) maps.