文献类型：期刊文献

英文题名：EM Algorithm for Estimating Reliability of Multi-Release Open Source Software Based on General Masked Data

作者：Yang, Jianfeng Chen, Jing Wang, Xibin

第一作者：Yang, Jianfeng

通信作者：Yang, JF[1];Chen, J[2];Yang, JF[3]

机构：[1]Guizhou Inst Technol, Sch Data Sci, Guiyang 550003, Peoples R China;[2]Guizhou Univ Tradit Chinese Med, Coll Informat Engn, Guiyang 550025, Peoples R China;[3]Special Key Lab Artifcial Intelligence & Intellig, Guiyang 550003, Peoples R China

第一机构：贵州理工学院

通信机构：corresponding author), Guizhou Inst Technol, Sch Data Sci, Guiyang 550003, Peoples R China;corresponding author), Guizhou Univ Tradit Chinese Med, Coll Informat Engn, Guiyang 550025, Peoples R China;corresponding author), Special Key Lab Artifcial Intelligence & Intellig, Guiyang 550003, Peoples R China.|贵州理工学院;

年份：2021

卷号：9

起止页码：18890-18903

外文期刊名：IEEE ACCESS

收录：;EI(收录号：20210609895834);Scopus(收录号：2-s2.0-85100471124);WOS:【SCI-EXPANDED(收录号:WOS:000619377900001)】；

基金：This work was supported in part by the National Natural Science Foundation of China under Grant 71901078, in part by the Science and Technology Foundation of Guizhou under Grant QianKeHeJiChu[2020]1Y269, and in part by the Special Key Laboratory of Artificial Intelligence and Intelligent Control of Guizhou Province under Grant QianJiaoHeKY[2020]001.

语种：英文

外文关键词：Software reliability; Reliability; Data models; Software; Open source software; Additives; Mathematical model; General masked data; multi-release open source software; reliability model; maximum likelihood estimation; EM~algorithm

摘要：Multi-release is critical for modern open source software product in order to satisfy more customer requirements. Masked data, a kind of missing data, is the system failure data when the exact cause of the failures might be unknown. That is, the cause of the system failures may be any one of the objects. However, due to the influence of the test strategy in real project, the cause of the system failures may be a subset of the system objects, not any one of the objects. In this paper, the mathematical description of general masked data is presented based on the traditional masked data. Furthermore, a novel multi-release open source software (OSS) reliability model based on general masked data is proposed. Different from traditional multi-release OSS reliability model, the proposed approach is based on additive model with general masked data other than change point model. And then, the maximum likelihood estimation (MLE) process of the model parameters is derived in detail, and expectation maximization (EM) algorithm is used to solve the extremely complicated problem of the log-likelihood function. Finally, two data sets from real open source software project are applied to the proposed approach, and the results show that the proposed reliability model is useful and powerful.